image_embedding:meeting
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meeting schedule
03/09/2019
- S. Chopra, R. Hadsell and Y. LeCun, “Learning a similarity metric discriminatively, with application to face verification,” 2005 IEEE Computer Society Conference on Computer Vision and Pattern Recognition (CVPR'05), San Diego, CA, USA, 2005, pp. 539-546 vol. “http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=1467314&isnumber=31472”
Abtract:Early version of contrasive loss and Smilarity metric
image_embedding/meeting.1567516707.txt.gz · Last modified: 2019/09/03 09:18 by stonelu